Please join us at the annual SIOP Leading Edge Consortium (LEC) on October 25 – 26 at Loews Hotel in Atlanta, Georgia, with workshops taking place on the 24th. (Sessions begin at 8 am on the 25th and end by 3 pm on the 26th.)
This year's co-chairs:
John Scott, APTMetrics, Inc.
Doug Reynolds, Development Dimensions International (DDI)
LEC Overview
Technology-enhanced assessments for selection and development have increasingly flourished over the past several decades. Sophisticated assessment programs that weren’t possible even a few years ago can now be assembled and launched on a global scale to measure almost any attribute in any language with greater realism, efficiency, and precision than ever before. As a new generation of technology-driven applications comes of age, a host of new issues and opportunities have emerged which require assessment professionals to respond with an informed perspective that balances business’s return-on-investment priorities with appropriate professional and scientific rigor.
The field of assessment is at a critical stage in its evolution. The intersection of new technologies, globalization, and market shifts among assessment providers have created significant tensions for both science and practice that require ongoing vigilance and creativity.Few forums exist to integrate the advancements in practice fueled by these trends and the streams of research that might inform their course of development.
The 2019 LEC is focused on bringing together a diverse group of thought leaders who explore the evolving state of practice and related science and frame out practical solutions for managing the disruption and incorporating new insights and technologies into organizational assessment programs.